发明名称 X-RAY INSPECTION APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide an x-ray inspection apparatus capable of retrieving an image photographed in the past from an object or detecting the object or a portion in the object from the image photographed in the past. <P>SOLUTION: An appearance image I<SB POS="POST">1</SB>to be an object is selected from an appearance image group I composed of a plurality of appearance images stored in a table in the past. When an x-ray fluoroscopic image F<SB POS="POST">100</SB>associated with the selected appearance image I<SB POS="POST">1</SB>and stored in the table in the past is read out and displayed on a monitor 10M, the x-ray fluoroscopic image F<SB POS="POST">100</SB>associated with an object (sample) of the selected appearance image I<SB POS="POST">1</SB>can be displayed from the object and an image photographed in the past can be retrieved from the object. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012237577(A) 申请公布日期 2012.12.06
申请号 JP20110105110 申请日期 2011.05.10
申请人 SHIMADZU CORP 发明人 IWAO YOSHIHIKO
分类号 G01N23/04 主分类号 G01N23/04
代理机构 代理人
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