| 摘要 |
According to one embodiment, a semiconductor device includes first and second pull-up deriver units, a pull-down driver unit, and a calibration circuit including a comparator. The first and second pull-up driver units adjust a pull-up driver. The pull-down driver unit adjusts a pull-down driver. When calibrating the pull-up driver, the calibration circuit causes the comparator to compare a reference voltage with the output voltage of the first pull-up driver unit based on a reference resistance. When calibrating the pull-down driver, the calibration circuit causes the comparator to compare the reference voltage with the voltage of a connection node between the second pull-up driver unit and pull-down driver unit.
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