发明名称 |
ELECTRICAL-CIRCUIT MANUFACTURING ASSISTANCE DEVICE AND ELECTRICAL-CIRCUIT MANUFACTURING ASSISTANCE METHOD |
摘要 |
<p>The present invention efficiently provides quality-related assistance for the manufacture of electrical circuits by means of an electrical-circuit manufacturing line. On the basis of processing-device-related information that includes information on operations performed on substrates by a substrate-processing device and/or information on actions performed on said substrate-processing device, a change in substrate processing conditions is recognized (154); work locations in which said change could affect work quality are identified and at least one of said work locations is selected to monitor (156); and a determination is made regarding change in work quality at said location(s) (158). Said determination is made by comparing the following: comparison data regarding circuit boards processed before the abovementioned change in substrate processing conditions; and comparison data regarding circuit boards processed after said change. Said comparison data includes at least one of the following: operation-dependent data acquired so as to depend on the operations performed by the abovementioned substrate-processing device; and inspection data from an inspection device that inspects work results.</p> |
申请公布号 |
WO2012165275(A1) |
申请公布日期 |
2012.12.06 |
申请号 |
WO2012JP63277 |
申请日期 |
2012.05.24 |
申请人 |
FUJI MACHINE MFG. CO., LTD.;HANEDA, HIROYUKI;NAKAYAMA, DAISUKE |
发明人 |
HANEDA, HIROYUKI;NAKAYAMA, DAISUKE |
分类号 |
H05K13/00;H05K3/34;H05K13/04;H05K13/08 |
主分类号 |
H05K13/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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