发明名称 METHODS FOR REPAIRING LOW-K DIELECTRICS USING CARBON PLASMA IMMERSION
摘要 Methods for repairing low-k dielectrics using a plasma immersion carbon doping process are provided herein. In some embodiments, a method of repairing a low-k dielectric material disposed on a substrate having one or more features disposed through the low-k dielectric material may include depositing a conformal oxide layer on the low-k dielectric material and within the one or more features; and doping the conformal oxide layer with carbon using a plasma doping process.
申请公布号 US2012309114(A1) 申请公布日期 2012.12.06
申请号 US201113150843 申请日期 2011.06.01
申请人 YAO DAPING;PORSHNEV PETER I.;APPLIED MATERIALS, INC. 发明人 YAO DAPING;PORSHNEV PETER I.
分类号 H01L21/02 主分类号 H01L21/02
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