发明名称 |
METHOD FOR FORMING GATE INSULATING FILM, AND DEVICE FOR FORMING GATE INSULATING FILM |
摘要 |
<p>A method for forming a gate insulating film, in which a gate insulating film is formed on a semiconductor substrate, comprises: a film formation step of forming a high-dielectric film on the semiconductor substrate using CVD or ALD; a first modification step of applying radial treatment to, and modifying, the formed high-dielectric film at a temperature lower than the film formation temperature; and a second modification step of applying heat treatment to, and causing crystallization in, the high-dielectric film formed in the first modification step.</p> |
申请公布号 |
WO2012165263(A1) |
申请公布日期 |
2012.12.06 |
申请号 |
WO2012JP63219 |
申请日期 |
2012.05.23 |
申请人 |
TOKYO ELECTRON LIMITED;AOYAMA SHINTARO;IGETA MASANOBU;HAKAMATA TAKAHIRO;FUJINO YUTAKA;KITAGAWA JUNICHI;AKIYAMA KOJI;CLARK ROBERT;TAKEYAMA TAMAKI |
发明人 |
AOYAMA SHINTARO;IGETA MASANOBU;HAKAMATA TAKAHIRO;FUJINO YUTAKA;KITAGAWA JUNICHI;AKIYAMA KOJI;CLARK ROBERT;TAKEYAMA TAMAKI |
分类号 |
H01L21/336;C23C16/56;H01L21/31;H01L21/316;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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