发明名称 METHOD FOR FORMING GATE INSULATING FILM, AND DEVICE FOR FORMING GATE INSULATING FILM
摘要 <p>A method for forming a gate insulating film, in which a gate insulating film is formed on a semiconductor substrate, comprises: a film formation step of forming a high-dielectric film on the semiconductor substrate using CVD or ALD; a first modification step of applying radial treatment to, and modifying, the formed high-dielectric film at a temperature lower than the film formation temperature; and a second modification step of applying heat treatment to, and causing crystallization in, the high-dielectric film formed in the first modification step.</p>
申请公布号 WO2012165263(A1) 申请公布日期 2012.12.06
申请号 WO2012JP63219 申请日期 2012.05.23
申请人 TOKYO ELECTRON LIMITED;AOYAMA SHINTARO;IGETA MASANOBU;HAKAMATA TAKAHIRO;FUJINO YUTAKA;KITAGAWA JUNICHI;AKIYAMA KOJI;CLARK ROBERT;TAKEYAMA TAMAKI 发明人 AOYAMA SHINTARO;IGETA MASANOBU;HAKAMATA TAKAHIRO;FUJINO YUTAKA;KITAGAWA JUNICHI;AKIYAMA KOJI;CLARK ROBERT;TAKEYAMA TAMAKI
分类号 H01L21/336;C23C16/56;H01L21/31;H01L21/316;H01L29/78 主分类号 H01L21/336
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