SAMPLE ROD FOR COMPREHENSIVELY TESTING IN-SITU STRESS AND ELECTRIC PERFORMANCE FOR TRANSMISSION ELECTRON MICROSCOPE WITH TWO AXES INCLINED

摘要

A sample rod for comprehensively testing in-situ stress and electric performance for a transmission electron microscope with two axes inclined, comprising a transmission electron microscope sample rod, a stress and electric performance sensor, a pressing disc, a sample head front end, and a sensor carrier; the stress and electric performance sensor is fixed on the sensor carrier at the front end of the sample rod by the pressing disc; the sensor carrier is connected with the front end of the sample rod by rotation axes arranged at the two sides of the carrier, and can rotate around the two rotation axes in a plane perpendicular to the front end of the sample rod (namely, rotating ±30 degrees around a Y-axis); the electrodes on the stress and electric performance sensor are connected to the electrodes at the two sides of the front end of the sample rod by the pressing disc, and are connected to an external testing device by a conducting wire in the sample rod to realize real-time monitoring to the in-plane (in a sensor plane) loading and feedback of stress and electrical signals. The present invention can incline research samples under a low index positive zone axis to observe the size of an in-situ atom and simultaneously obtains the stress and electrical comprehensive performance parameters.