发明名称 FEATURE SELECTING DEVICE, FEATURE SELECTING METHOD, AND FEATURE SELECTING PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To provide a feature selecting device obtaining a high identification rate of pattern recognition. <P>SOLUTION: The feature selecting device for improving identification accuracy of pattern recognition by selecting a learning sample and feature using a genetic algorithm includes: standard pattern creation means for creating a standard pattern of a category from a selected learning sample set and a selected feature; and identification means for calculating a distance between the created standard pattern and the sample based on the selected feature, and identifying a category to which the standard pattern having the smallest distance belongs, as the identification result of the sample. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012238076(A) 申请公布日期 2012.12.06
申请号 JP20110105151 申请日期 2011.05.10
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 SUZUKI AKIRA;MORIMOTO MASASHI;YONEMURA SHUNICHI;SHIMADA SATOSHI
分类号 G06N3/00 主分类号 G06N3/00
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