发明名称 |
METHOD FOR ESTIMATING DEFECTS IN AN OBJECT AND DEVICE FOR IMPLEMENTING SAME |
摘要 |
The invention relates to a device and method for estimating defects potentially present in an object comprising an outer surface, wherein the method comprises the steps of: a) illuminating the outer surface of the object with an inductive wave field at a predetermined frequency; b) measuring an induced wave field ({right arrow over (H)}) at the outer surface of the object; c) developing from the properties of the object's material a coupling matrix T associated with a depth Z of the object from the outer surface; d) solving the matrix system  ?  ( [ H → 0 → ? ] = T · J → ) ?  indicates text missing or illegible when filed in order to determine a vector ({right arrow over (J)}) at depth Z; e) extracting a sub-vector ({right arrow over (J)}S) from the vector ({right arrow over (J)}) corresponding to a potential defect on the object at depth Z; and f) quantitatively estimating the potential defect from the sub-vector ({right arrow over (J)}S) at depth Z. |
申请公布号 |
US2012308120(A1) |
申请公布日期 |
2012.12.06 |
申请号 |
US201013575420 |
申请日期 |
2010.12.28 |
申请人 |
PLACKO DOMINIQUE;JOUBERT PIERRE-YVES;RIVOLLET ALAIN;CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS) |
发明人 |
PLACKO DOMINIQUE;JOUBERT PIERRE-YVES;RIVOLLET ALAIN |
分类号 |
G06K9/46;G06K9/00 |
主分类号 |
G06K9/46 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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