发明名称 Semiconductor device and method for manufacturing the same
摘要 <p>PURPOSE: A semiconductor device and a manufacturing method thereof are provided to easily perform a photo process for forming a wire by including a first pattern spacer which covers the upper side and lateral side of a second gate pattern and a group spacer which covers the upper side and lateral side of a gate group. CONSTITUTION: A substrate(100) includes a first region(CA) and a second region(PA). A gate group(G) includes a plurality of cell gate patterns and selection gate patterns. A group spacer(185) covers the upper side and lateral side of the gate group. The group spacer has a first inflection point. A first pattern spacer(186) covers the upper side and lateral side of the first gate pattern. The first pattern spacer has a second inflection point.</p>
申请公布号 KR20120131879(A) 申请公布日期 2012.12.05
申请号 KR20110050357 申请日期 2011.05.26
申请人 发明人
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
代理机构 代理人
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