发明名称 SEMICONDUCTOR DEVICE
摘要 <p>A parallel p-n layer (20) is provided as a drift layer between an active portion and an n + drain region (11). The parallel p-n layer (20) is formed by an n-type region (1) and a p-type region (2) being repeatedly alternately joined. An n-type high concentration region (21) is provided on a first main surface side of the n-type region (1). The n-type high concentration region (21) has an impurity concentration higher than that of an n-type low concentration region (22) provided on a second main surface side of the n-type region (1). The n-type high concentration region (21) has an impurity concentration 1.2 times or more, 3 times or less, preferably 1.5 times or more, 2.5 times or less, greater than that of the n-type low concentration region (22). Also, the n-type high concentration region (21) has one-third or less, preferably one-eighth or more, one-fourth or less, of the thickness of a region of the n-type region (1) adjacent to the p-type region (2).</p>
申请公布号 EP2530721(A1) 申请公布日期 2012.12.05
申请号 EP20110737183 申请日期 2011.01.28
申请人 FUJI ELECTRIC CO., LTD. 发明人 ONISHI, YASUHIKO;KITAMURA, MUTSUMI;SUGI, AKIO;TAKEI, MANABU
分类号 H01L29/78;H01L29/06 主分类号 H01L29/78
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