<p>A parallel test payload includes a bit sequence configured to be segmented into a plurality of sub-sequences having variable bit length carriers. Respective carriers are represented uniformly in each one of the plurality of sub-sequences.</p>
申请公布号
EP2529331(A1)
申请公布日期
2012.12.05
申请号
EP20100844872
申请日期
2010.01.29
申请人
HEWLETT PACKARD DEVELOPMENT COMPANY, L.P.
发明人
ULICHNEY, ROBERT ALAN;SIMSKE, STEVEN J.;GAUBATZ, MATTHEW D.
