发明名称 Electrical connection defect detection device
摘要 An electrical connection defect detection device to detect whether an electrical connection between an under-test pin of an under-test device and a signal line of a circuit board is normal is provided. The electrical connection defect detection device comprises a signal provider providing a test signal to the under-test pin through the signal line, a detection module and an electrode board comprising a detection surface and at least one array of through holes. The detection surface contacts a surface of the under-test device to make the detection module detect a capacitance value associated with the electrode board, the under-test pin and the signal line larger than a threshold value when their connection is normal. The through holes are placed along the edges of the electronic board and are electrically connected to a ground potential to perform a capacitive shielding.
申请公布号 US8324908(B2) 申请公布日期 2012.12.04
申请号 US20100761481 申请日期 2010.04.16
申请人 TSAI SU-WEI;YEH SHANG-TSANG;TEST RESEARCH, INC. 发明人 TSAI SU-WEI;YEH SHANG-TSANG
分类号 G01R31/04 主分类号 G01R31/04
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