发明名称 |
Electrical connection defect detection device |
摘要 |
An electrical connection defect detection device to detect whether an electrical connection between an under-test pin of an under-test device and a signal line of a circuit board is normal is provided. The electrical connection defect detection device comprises a signal provider providing a test signal to the under-test pin through the signal line, a detection module and an electrode board comprising a detection surface and at least one array of through holes. The detection surface contacts a surface of the under-test device to make the detection module detect a capacitance value associated with the electrode board, the under-test pin and the signal line larger than a threshold value when their connection is normal. The through holes are placed along the edges of the electronic board and are electrically connected to a ground potential to perform a capacitive shielding.
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申请公布号 |
US8324908(B2) |
申请公布日期 |
2012.12.04 |
申请号 |
US20100761481 |
申请日期 |
2010.04.16 |
申请人 |
TSAI SU-WEI;YEH SHANG-TSANG;TEST RESEARCH, INC. |
发明人 |
TSAI SU-WEI;YEH SHANG-TSANG |
分类号 |
G01R31/04 |
主分类号 |
G01R31/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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