发明名称 Method for setting test point
摘要 A method for setting a test point is applied to dispose at least one test point on a circuit board in a trace file, which includes steps of reading the trace file, in which the trace file includes at least one trace; determining whether the trace has an initial test point; and setting a test point on the trace that does not have the initial test point. According to the method for setting a test point, cost and time for manually disposing the test point are saved, and an error rate when the test point is arranged is further reduced, thereby effectively improving production efficiency of the circuit board.
申请公布号 US8327314(B2) 申请公布日期 2012.12.04
申请号 US201113014300 申请日期 2011.01.26
申请人 CHENG LI-JUNG;INVENTEC CORPORATION 发明人 CHENG LI-JUNG
分类号 G06F17/50 主分类号 G06F17/50
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