发明名称 liquid crystal display and method for an examination of a line of the same
摘要 PURPOSE: A liquid crystal display and a method for examining a line of the same are provided to measures a signal waveform which is supplied to a specific data line through a FPC(flexible printed circuit) pad even if laser welding is performed on an overlap region of a test pattern line and a data line. CONSTITUTION: Gate lines(11) are prepared on a substrate. Data lines(31) are crossed toward the gate lines. A pattern line for test(7) is overlapped with at least one among the gate lines and the data lines. If laser welding is performed on an overlap region of the pattern line for test and a gate connection line, the signal waveform which is supplied to the gate connection line through a specific gate line to a FP pad through the pattern line for test.
申请公布号 KR20120130593(A) 申请公布日期 2012.12.03
申请号 KR20110048649 申请日期 2011.05.23
申请人 发明人
分类号 G02F1/1345;G02F1/13;G02F1/133 主分类号 G02F1/1345
代理机构 代理人
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