发明名称 MEASUREMENT SURFACE INCLINATION MEASURING DEVICE, PROJECTOR, AND MEASUREMENT SURFACE INCLINATION MEASURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To miniaturize a projection surface inclination measuring device and a projector. <P>SOLUTION: A projection surface inclination measuring device 11 comprises a light projection unit and incident angle sensors. The incident angle sensors are arranged respectively by two in a horizontal direction and in a vertical direction. The light projection unit projects light to two range-finding points set respectively in the horizontal direction and in the vertical direction on a screen S to form light projection spots. The incident angle sensor receives reflected light from the light projection spots, and detects incident angle of the reflected light. The incident angle sensor consists of two-split light receiving elements, and detects the incident angle of the reflected light on the basis of a light receiving rate of the light entering two light receiving elements. By this constitution, an essential lens in a phase sensor is not required, and focal distance of a lens is not required to be secured to enable miniaturization. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012233920(A) 申请公布日期 2012.11.29
申请号 JP20120184776 申请日期 2012.08.24
申请人 CASIO COMPUT CO LTD 发明人 INOUE HIDEAKI
分类号 G01B11/26;G03B21/00;G03B21/14 主分类号 G01B11/26
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