发明名称 |
MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device having achieved microfabrication while suppressing a defect. <P>SOLUTION: By forming a convex part or a trench (groove) in an insulation layer and providing a channel formation region of a semiconductor layer in contact with the convex part or the trench, the channel formation region is extended in a substrate vertical direction. This can extend the effective channel length while achieving the microfabrication of the transistor. Moreover, by performing R-processing treatment on an upper end corner part of the convex part or the trench in contact with the semiconductor layer before the formation of the semiconductor layer, the thin semiconductor layer can be formed with excellent coverage. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012235103(A) |
申请公布日期 |
2012.11.29 |
申请号 |
JP20120094372 |
申请日期 |
2012.04.18 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
SASAGAWA SHINYA;ISHIZUKA AKIHIRO |
分类号 |
H01L29/786;G02F1/1368;H01L21/336;H01L21/8242;H01L21/8247;H01L27/10;H01L27/108;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L29/786 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|