发明名称 |
METHOD AND APPARATUS FOR OBJECT/MATERIAL DETECTION |
摘要 |
Methods and apparatus to compare the size of a target from the first sensor information with the size of the target from the second sensor information to determine whether an anomaly exists based upon the size comparison. In one embodiment, the size of the target from the first sensor information is affected by dielectric constants for at least one material of interest associated with the target. |
申请公布号 |
US2012300067(A1) |
申请公布日期 |
2012.11.29 |
申请号 |
US201213480027 |
申请日期 |
2012.05.24 |
申请人 |
NAQVI WASEEM;RAYTHEON COMPANY |
发明人 |
NAQVI WASEEM |
分类号 |
G01S13/00;G08B21/00;H04K3/00;H04N7/18 |
主分类号 |
G01S13/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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