发明名称 SYSTEM AND METHOD FOR NON-DESTRUCTIVE TESTING
摘要 Non-destructive testing and examination systems and methods generate models and other representations of a part. These models can be used to perform analysis such as defect detection and categorization. The present disclosure identifies, in one embodiment, a method and system that identifies particular locations on the part for analysis. These locations correspond to regions of a reference model, which may comprise a representation of the part that a computer aided design (CAD) package can generate. The method provides for test parameters to be assigned or associated with the region so as to direct and instruct the execution of the relevant part analysis protocols. In one example, the test parameters identify criteria for one or more types of defects that may be found on the part.
申请公布号 US2012303333(A1) 申请公布日期 2012.11.29
申请号 US201113116946 申请日期 2011.05.26
申请人 STUKE INGO;WUESTENBECKER MICHAEL;BEYER ANDREAS;LUX HOLGER;HORN LOTHAR;GENERAL ELECTRIC COMPANY 发明人 STUKE INGO;WUESTENBECKER MICHAEL;BEYER ANDREAS;LUX HOLGER;HORN LOTHAR
分类号 G06F17/50 主分类号 G06F17/50
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