发明名称 INSPECTION ELEMENT, INSPECTION DEVICE AND INSPECTION SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To achieve improvement in inspection efficiency that is problematically difficult since specimen inspection conventionally requires calibration to be performed before each inspection, which requires a reagent for calibration each time and also requires time for calibration, thereby causing deterioration in total TAT (Turn Around Time) for an inspection system. <P>SOLUTION: An inspection element used for performing specimen inspection is provided. The inspection element is provided on its surface and/or inside with an information recording part that stores information about characteristics of the inspection element. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012233735(A) 申请公布日期 2012.11.29
申请号 JP20110100981 申请日期 2011.04.28
申请人 CANON INC 发明人 OGURA MASAYA
分类号 G01N35/00 主分类号 G01N35/00
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