| 摘要 |
<p>The invention relates to a device and method for flatness measurement of a surface wherein the device comprises a frame, at least one distance sensor connected to the frame, a control unit for the at least one distance sensor and a data processing unit for processing data from the at least one distance sensor. The deviation of flatness is determined by taking a number of measurements over a certain length and determining maximum variation from a straight line.</p> |
