| 摘要 |
PURPOSE: An apparatus and method for repairing a semiconductor memory are provided to reduce the repair time of a semiconductor memory device by replacing fault memory cells with a spare memory block through a node search five times. CONSTITUTION: A fault memory cell is detected(S301). The fault memory cell is classified into a master fault cell or slave fault cell according to a cell address(S302). The number of the master fault cells is compared with the number of the spare memory blocks(S303). The fault memory cells are geometrically classified(S304). The geometrically classified fault memory cells are replaced with the spare memory blocks(S305). [Reference numerals] (AA) Start; (BB,EE) Yes; (CC,DD) No; (FF) Finish; (S301) Detecting a fault memory cell; (S302) Classifying a fault memory cell into a master fault cell or slave fault cell; (S303) Is the number of master fault cells larger than the number of memory blocks ?; (S304) Classifying fault memory cells with a geometric type; (S305) Replacing fault memory cells with a spare memory block; (S306) Are all fault memory cells repaired ? |
