发明名称 |
OXIDE SEMICONDUCTOR DEVICE, METHOD OF FORMING AN OXIDE SEMICONDUCTOR DEVICE, AND DISPLAY DEVICE HAVING AN OXIDE SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING A DISPLAY DEVICE HAVING AN OXIDE SEMICONDUCTOR DEVICE |
摘要 |
<p>PURPOSE: An oxide semiconductor device, a method for manufacturing the same, a display device having the oxide semiconductor device, a method for manufacturing the display device having the oxide semiconductor device are provided to effectively remove etching damage and residual stress which is generated in a gate insulating layer by forming a recess on the gate insulating layer between a drain electrode and a source electrode. CONSTITUTION: A gate electrode(10) is formed on a substrate(5). A gate insulating layer(15) includes a recess structure which is placed on the top of the gate electrode. A source electrode(20) is formed on one side of the gate insulating layer. A drain electrode(25) is formed on the other side of the gate insulating layer. An active pattern(30) is formed on the source electrode and the drain electrode.</p> |
申请公布号 |
KR20120128274(A) |
申请公布日期 |
2012.11.27 |
申请号 |
KR20110046116 |
申请日期 |
2011.05.17 |
申请人 |
|
发明人 |
|
分类号 |
H01L29/786;G02F1/136;H01L21/336 |
主分类号 |
H01L29/786 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|