发明名称 OXIDE SEMICONDUCTOR DEVICE, METHOD OF FORMING AN OXIDE SEMICONDUCTOR DEVICE, AND DISPLAY DEVICE HAVING AN OXIDE SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING A DISPLAY DEVICE HAVING AN OXIDE SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: An oxide semiconductor device, a method for manufacturing the same, a display device having the oxide semiconductor device, a method for manufacturing the display device having the oxide semiconductor device are provided to effectively remove etching damage and residual stress which is generated in a gate insulating layer by forming a recess on the gate insulating layer between a drain electrode and a source electrode. CONSTITUTION: A gate electrode(10) is formed on a substrate(5). A gate insulating layer(15) includes a recess structure which is placed on the top of the gate electrode. A source electrode(20) is formed on one side of the gate insulating layer. A drain electrode(25) is formed on the other side of the gate insulating layer. An active pattern(30) is formed on the source electrode and the drain electrode.</p>
申请公布号 KR20120128274(A) 申请公布日期 2012.11.27
申请号 KR20110046116 申请日期 2011.05.17
申请人 发明人
分类号 H01L29/786;G02F1/136;H01L21/336 主分类号 H01L29/786
代理机构 代理人
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