发明名称 Methods and circuits for measuring mutual and self capacitance
摘要 Capacitance measurement circuits for measuring self and mutual capacitances are described. In one embodiment the capacitance measurement circuit includes: a first electrode capacitively coupled with a second electrode; a first plurality of switches coupled with the first electrode; and a second plurality of switches coupled with the second electrode, wherein, during a first operation stage, the first plurality of switches is configured to apply a first initial voltage to the first electrode and the second plurality of switches is configured to apply a second initial voltage to the second electrode, and wherein, during a second operation stage, the first plurality of switches is configured to connect the first electrode with a measurement circuit, and the second plurality of switches is configured to connect the second electrode with a constant voltage.
申请公布号 US8319505(B1) 申请公布日期 2012.11.27
申请号 US20090606147 申请日期 2009.10.26
申请人 MAHARYTA ANDRIY;CYPRESS SEMICONDUCTOR CORPORATION 发明人 MAHARYTA ANDRIY
分类号 G01R27/26 主分类号 G01R27/26
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