发明名称 Compressive polycrystalline silicon film and method of manufacture thereof
摘要 In one embodiment a method of forming a compressive polycrystalline semiconductive material layer is disclosed. The method comprises forming a polycrystalline semiconductive seed layer over a substrate and forming a silicon layer by depositing silicon directly on the polycrystalline silicon seed layer under amorphous process conditions at a temperature below 600 C.
申请公布号 US8318575(B2) 申请公布日期 2012.11.27
申请号 US201113022411 申请日期 2011.02.07
申请人 LEHNERT WOLFGANG;POMPL STEFAN;MEYER MARKUS;INFINEON TECHNOLOGIES AG 发明人 LEHNERT WOLFGANG;POMPL STEFAN;MEYER MARKUS
分类号 H01L21/20;H01L21/00;H01L21/36 主分类号 H01L21/20
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