发明名称 Method of reading data in non-volatile memory device
摘要 In a method of reading data from a non-volatile memory device, read data is generated based on a word line voltage. The read data includes data read from a plurality of sectors included in the non-volatile memory device. Bad sector data is transferred data based on read data and bad sector information. The bad sector data corresponds to data read from at least one bad sector included in the plurality of sectors. The bad sector information is updated by checking error bits of the bad sector data. The word line voltage is generated based on the updated bad sector information.
申请公布号 US8321765(B2) 申请公布日期 2012.11.27
申请号 US20100702481 申请日期 2010.02.09
申请人 LEE JIN-WOOK;HWANG SANG-WON;SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE JIN-WOOK;HWANG SANG-WON
分类号 G11C29/00 主分类号 G11C29/00
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