发明名称 |
Microresistivity imaging at multiple depths of investigation |
摘要 |
A microresistivity logging tool includes a dual function electrode deployed between a guard electrode and a return electrode. A drive circuit enables the electrical potential of the dual function electrode to be independently controlled so as to control a depth of investigation of a microresistivity measurement. The depth of investigation tends to increase with increasing electrical potential of the dual function electrode. |
申请公布号 |
US8319498(B2) |
申请公布日期 |
2012.11.27 |
申请号 |
US20090581237 |
申请日期 |
2009.10.19 |
申请人 |
WANG TSILI;SCHLUMBERGER TECHNOLOGY CORPORATION |
发明人 |
WANG TSILI |
分类号 |
G01V3/00 |
主分类号 |
G01V3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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