DEVICE FOR MEASURING ENVIRONMENTAL FORCES AND METHOD OF FABRICATING THE SAME

摘要

A device for measuring environmental forces, and a method for fabricating the same, is disclosed that comprises a device wafer, the device wafer comprising a first device layer separated from a second device layer by a first insulation layer. The first device wafer is bonded to an etched substrate wafer to create a suspended diaphragm and boss, the flexure of which is determined by an embedded sensing element.