| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a thin-sliced sample fabrication device and a thin-sliced sample fabrication method, which allow discrimination between a sample portion and an embedding-agent portion on the surface of a sample block, without depending only on brightness data of image data, to determine whether an area size of the sample portion is sufficient for fabricating a thin-sliced sample. <P>SOLUTION: A thin-sliced sample fabrication device includes: a cutter part for thinly slicing a surface of a sample block 1; a surface developing determination part 10 for determining whether an area size of the surface of the sample block is sufficient for fabricating a thin-sliced sample; and a sample block transport part. Further, the surface developing determination part includes: an irradiation part 3 for irradiating a surface of the sample block with light; an imaging part 4 for receiving reflection light resulting from the irradiated light reflecting on the surface of the sample block to obtain image data for two mutually different-color light; an image data processing part 6 for discriminating between a sample portion and an embedding-agent portion on the basis of the obtained image data; and a control part 8 for determining whether an area size of the surface portion of the sample block is sufficient for fabricating a thin-sliced sample. <P>COPYRIGHT: (C)2013,JPO&INPIT |
