发明名称 CUTOFF WAVELENGTH MEASURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for accurately measuring a cutoff wavelength of a higher mode for an optical fiber. <P>SOLUTION: A cutoff wavelength measuring method in the invention includes: (1) a first step of measuring a power spectrum P1(&lambda;) of light output from a light source; (2) a second step of arranging a measured optical fiber 10 in such a shape (preferably spiral shape) that curvature changes in a longitudinal direction, allowing the light output from the light source to enter one end of the measured optical fiber 10, and measuring a power spectrum P2(&lambda;) of the light output from the other end of the measured optical fiber 10; (3) a third step of obtaining a difference spectrum P(&lambda;) that shows a difference between the power spectrum P2(&lambda;) and the power spectrum P1(&lambda;); and (4) a fourth step of obtaining a cutoff wavelength in a higher mode for the measured optical fiber on the basis of the difference spectrum P(&lambda;). <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012230051(A) 申请公布日期 2012.11.22
申请号 JP20110099486 申请日期 2011.04.27
申请人 SUMITOMO ELECTRIC IND LTD 发明人 NAKANISHI TETSUYA
分类号 G01M11/02 主分类号 G01M11/02
代理机构 代理人
主权项
地址