发明名称 Optoelectronic Devices Having Deep Level Defects and Associated Methods
摘要 Semiconductor structures, devices, and methods that can exhibit various enhanced properties, such as, for example, enhanced light detection properties are provided. In one aspect, for example, an optoelectronic device can include a semiconductor material having an enhanced absorption region and a first defect in the enhanced absorption region, where the first defect is a deep-level defect generated by a first defect carrier type that is either a deep-level donor carrier type or a deep-level acceptor carrier type. The device can also include a second defect in the enhanced absorption region, where the second defect is either a shallow-level defect or a deep-level defect, and where the second defect is generated by a second defect carrier type that is opposite to the first defect carrier type. Furthermore, the enhanced absorption region has an external quantum efficiency of at least about 0.5% for electromagnetic radiation wavelengths greater than 1250 nm.
申请公布号 US2012292729(A1) 申请公布日期 2012.11.22
申请号 US201213472325 申请日期 2012.05.15
申请人 VINEIS CHRISTOPHER;SIONYX, INC. 发明人 VINEIS CHRISTOPHER
分类号 H01L31/0236;H01L31/18 主分类号 H01L31/0236
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