发明名称 METHOD AND DEVICE FOR INTELLIGENTLY PROCESSING EXPECTED EVENT IN AUTOMATIC TEST
摘要 <p>The present invention provides a method and device for intelligently processing an expected event in an automatic test. The method comprises the following steps: A: when an expected event occurs, acquiring handles of all possible next test objects; B: determining whether a cycle detection time exceeds a preset time limit, if yes, performing corresponding error handling, and otherwise, performing the step C; and C: according to the handles of the test objects, detecting eigenvalues of the test objects in a polling manner, and determining whether any one of the eigenvalues is in an operable state, if yes, a test script performing a next operation, and otherwise, returning to the step B. The present invention can implement an efficient automatic test in complex situations that, the rate of a test script and the response rate of a test object are asynchronous and a next test object is uncertain when an expected event occurs.</p>
申请公布号 WO2012155670(A1) 申请公布日期 2012.11.22
申请号 WO2012CN72851 申请日期 2012.03.22
申请人 ZTE CORPORATION;ZHENG, ZHONG 发明人 ZHENG, ZHONG
分类号 G06F11/36 主分类号 G06F11/36
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