发明名称 |
METHOD AND APPARATUS FOR PERFORMING X-RAY ANALYSIS OF A SAMPLE |
摘要 |
The invention provides a method of performing X-ray diffraction (XRD) and/or X-ray fluorescence (XRF) analysis of a sample, comprising: irradiating a sample with X-rays from an X-ray source; providing a combined XRD and XRF detection arrangement comprising a scanning wavelength selector and at least one X-ray detector for detecting X-rays selected by the wavelength selector; and performing XRD analysis of the sample by selecting at least one fixed wavelength of X-rays diffracted by the sample using the scanning wavelength selector and detecting X-rays of the selected fixed wavelength(s) at one or more values of the diffraction angle cp at the sample using the X-ray detector(s); and/or performing XRF analysis of the sample by scanning wavelengths of X-rays emitted by the sample using the scanning wavelength selector and detecting X-rays of the scanned wavelengths using the X-ray detector(s). Also provided is an apparatus for performing both X-ray diffraction (XRD) and X-ray fluorescence (XRF) analysis of a sample comprising a combined XRD and XRF detection arrangement comprising a scanning wavelength selector and at least one X-ray detector for detecting X-rays selected by the wavelength selector. |
申请公布号 |
US2012294418(A1) |
申请公布日期 |
2012.11.22 |
申请号 |
US201013515939 |
申请日期 |
2010.12.13 |
申请人 |
YELLEPEDDI RAVISEKHAR;NEGRO PIERRE-YVES;THERMO FISHER SCIENTIFIC (ECUBLENS) SARL |
发明人 |
YELLEPEDDI RAVISEKHAR;NEGRO PIERRE-YVES |
分类号 |
G01N23/223;G01N23/207 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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