发明名称 STRESSED SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING
摘要 A semiconductor device and method of manufacturing a semiconductor device is disclosed. The exemplary semiconductor device and method for fabricating the semiconductor device enhance carrier mobility. The method includes providing a substrate and forming a dielectric layer over the substrate. The method further includes forming a first trench within the dielectric layer, wherein the first trench extends through the dielectric layer and epitaxially (epi) growing a first active layer within the first trench and selectively curing with a radiation energy the dielectric layer adjacent to the first active layer.
申请公布号 US2012292639(A1) 申请公布日期 2012.11.22
申请号 US201113111732 申请日期 2011.05.19
申请人 LIAO MIAO-CHENG;HONG MIN HAO;KO HSIANG HSIANG;CHEN KEI-WEI;WANG YING-LANG;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIAO MIAO-CHENG;HONG MIN HAO;KO HSIANG HSIANG;CHEN KEI-WEI;WANG YING-LANG
分类号 H01L29/06;H01L21/762;H01L29/24 主分类号 H01L29/06
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