发明名称 SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING SYSTEM, AND PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device capable of preventing or suppressing increase in threshold voltage and preventing or suppressing decrease in flat band voltage, and a method of manufacturing the same. <P>SOLUTION: There is provided a semiconductor device comprising: a gate insulating film 30 formed on a semiconductor substrate 10; a TiN film 41 formed on the gate insulating film; a TiAlN film 43 formed on the TiN film 41; and a silicon film 45 formed on the TiAlN film 43. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012231123(A) 申请公布日期 2012.11.22
申请号 JP20120043872 申请日期 2012.02.29
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 OGAWA ARIHITO
分类号 H01L29/78;H01L21/28;H01L21/336 主分类号 H01L29/78
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