发明名称 |
SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING SYSTEM, AND PROGRAM |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device capable of preventing or suppressing increase in threshold voltage and preventing or suppressing decrease in flat band voltage, and a method of manufacturing the same. <P>SOLUTION: There is provided a semiconductor device comprising: a gate insulating film 30 formed on a semiconductor substrate 10; a TiN film 41 formed on the gate insulating film; a TiAlN film 43 formed on the TiN film 41; and a silicon film 45 formed on the TiAlN film 43. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012231123(A) |
申请公布日期 |
2012.11.22 |
申请号 |
JP20120043872 |
申请日期 |
2012.02.29 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
OGAWA ARIHITO |
分类号 |
H01L29/78;H01L21/28;H01L21/336 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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