| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an evoked potential inspection device which can shorten measuring time while maintaining high inspection accuracy. <P>SOLUTION: An evoked potential inspection device 1 includes an ASSR evoked potential signal data recording unit for recording ASSR evoked potential signal data, a waveform inference processing unit for carrying out a waveform inference processing for the ASSR evoked potential signal data recorded by the ASSR evoked potential signal data recording unit by means of a Kalman filter, a hearing ability judgment processing unit for carrying out a hearing ability judgment processing for the waveform signal data inferred by the waveform inference processing unit, and a display control unit for making a display device 5 show a result processed by the hearing ability judgment processing unit. <P>COPYRIGHT: (C)2013,JPO&INPIT |
