发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method and a semiconductor device which achieve a low-temperature process. <P>SOLUTION: By simultaneously adding an impurity element and hydrogen which add p-type characteristics to a part of a semiconductor layer with a crystalline configuration, an upper layer part of the part becomes non-crystalline and a crystalline material remains in a lower layer part of the part. By performing a heat treatment, hydrogen in the part is diffused. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012231160(A) |
申请公布日期 |
2012.11.22 |
申请号 |
JP20120148421 |
申请日期 |
2012.07.02 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
ISOBE ATSUO;TAKAYAMA TORU;ARAO TATSUYA |
分类号 |
H01L29/786;G09F9/30;H01L21/265;H01L21/336 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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