发明名称 |
OXIDE SEMICONDUCTOR DEVICES, METHODS OF MANUFACTURING OXIDE SEMICONDUCTOR DEVICES, DISPLAY DEVICES HAVING OXIDE SEMICONDUCTOR DEVICES, METHODS OF MANUFACTURING DISPLAY DEVICES HAVING OXIDE SEMICONDUCTOR DEVICES |
摘要 |
An oxide semiconductor device includes a gate electrode on a substrate, a gate insulation layer on the substrate, the gate insulation layer having a recess structure over the gate electrode, a source electrode on a first portion of the gate insulation layer, a drain electrode on a second portion of the gate insulation layer, and an active pattern on the source electrode and the drain electrode, the active pattern filling the recess structure.
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申请公布号 |
US2012292610(A1) |
申请公布日期 |
2012.11.22 |
申请号 |
US201113229606 |
申请日期 |
2011.09.09 |
申请人 |
WANG SEONG-MIN;AHN KI-WAN;YOON JOO-SUN;KIM KI-HONG |
发明人 |
WANG SEONG-MIN;AHN KI-WAN;YOON JOO-SUN;KIM KI-HONG |
分类号 |
H01L27/15;H01L21/36;H01L29/786;H01L33/00 |
主分类号 |
H01L27/15 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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