TECHNIQUE FOR IMAGING USING ARRAY OF FOCUSED VIRTUAL SOURCES USING PHASED EXCITATION

摘要

The invention relates to a method and a device for detecting, measuring and evaluating defects in an object and/or specific material property of an object using a phased array wave technique. The device comprises of a phased array transceiver probe/source and control unit for use in a phased array wave technique for transmitting and receiving wave signals on and from the area to be inspected. The phased array source is divided into a plurality of virtual probes/sources and each virtual probe/source comprises of plurality of elements arranged sequentially but without phasing for excitation.