| 摘要 |
<P>PROBLEM TO BE SOLVED: To accurately obtain information on the amount of an element to be analyzed of a component contained in an analysis object even when a measuring surface of the analysis object has a curvature. <P>SOLUTION: An quantitative information calculated from the fluorescence X-ray intensity is corrected based on the curvature 1/R or radius R of the surface of an analysis target 20 in a control part 11C. <P>COPYRIGHT: (C)2013,JPO&INPIT |
