A probe block for testing a panel including a plurality of rows of pads is provided. The probe block includes a body block configured to have a bottom surface inclined downward in a direction to contact the panel; a plurality of leaf springs configured to be stacked stepwise on the bottom surface of the body block, to have ends protruding outward more than an end of the body block 110 and having bottom surfaces located on the same plane and to have elasticity; and a sheet configured to be coupled to the leaf springs while enclosing ends of the leaf springs and to have electrode lines arranged on an insulating film so as to contact the pads for testing the panel, wherein each of the leaf springs exerts an elastic force and a pressure to a contacting portion between corresponding electrode lines of the sheet and a corresponding row of pads of the panel.
