发明名称 Fixing Apparatus of current probe for Conducted Emission Test
摘要 PURPOSE: A probe fixing apparatus for a conduction discharge test is provided to drastically reduce testing time and to improve convenience in test. CONSTITUTION: An electronic product of a conduction discharge test object is placed on a support member(10). An electric wire guide frame member(20) is connected to the support member and indicates gradation capable of checking distance with the support member in a longitudinal direction. A probe fixing member(30) is fixed on a set position of the electric wire guide frame member and forms an insertion part in which a probe for current measurement is inserted.
申请公布号 KR20120127103(A) 申请公布日期 2012.11.21
申请号 KR20110045364 申请日期 2011.05.13
申请人 发明人
分类号 G01R29/08;G01R19/165 主分类号 G01R29/08
代理机构 代理人
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