发明名称 Wafer for thin film transfer having a plurality of alignment keys for 3D stacking structure
摘要 <p>PURPOSE: A wafer for thin film transition is provided to prevent an excitation phenomenon of a thin film by improving adhesive force of the thin film and to reduce the generation of cracks in the thin film process. CONSTITUTION: A plurality of alignment key domains(20) is indicated on a wafer. Etching parts are etched from the surface of the wafer as a predetermined depth. An exhaust pipe path(24) connects the etching parts of a plurality of alignment keys. The exhaust pipe path is connected to the edge of the wafer. The exhaust pipe path is formed on the exterior of the plurality of alignment keys. A positive type alignment key and a negative type alignment key are mixed in the plurality of alignment keys.</p>
申请公布号 KR20120126210(A) 申请公布日期 2012.11.21
申请号 KR20110043834 申请日期 2011.05.11
申请人 发明人
分类号 H01L21/027 主分类号 H01L21/027
代理机构 代理人
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