发明名称 |
Test pattern generation for diagnosing scan chain failures |
摘要 |
Embodiments of the disclosed technology comprise techniques that can be used to generate scan chain test patterns and improve scan chain failure diagnosis resolution. For example, certain embodiments can be used to generate high quality chain diagnosis test patterns that are able to isolate a scan chain defect to a single scan cell. At least some embodiments can be used to locate faults over multiple capture cycles in the scan chain. |
申请公布号 |
US8316265(B2) |
申请公布日期 |
2012.11.20 |
申请号 |
US20090471227 |
申请日期 |
2009.05.22 |
申请人 |
GUO RUIFENG;CHENG WU-TUNG;HUANG YU;MENTOR GRAPHICS CORPORATION |
发明人 |
GUO RUIFENG;CHENG WU-TUNG;HUANG YU |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|