Single-sided infrared sensor for thickness or weight measurement of products containing a reflective layer

摘要

An optical, non-contact sensor for measuring the thickness or weight of layered products and particularly those that contain a light-reflective substrate incorporates a reflective surface to cause incident radiation from a light source to plurality of time within the layered products before being detected in a receiver. A diffusing element can be incorporated as a diffuse source of illumination. The Lambertian-type light scattering generated by the diffuse element causes the incident light to interact multiple times with the layered product resulting in enhanced sensor sensitivity to selected components in the layered product and measurement error induced by specular reflection of the light from the reflective substrate is minimized.