发明名称 Test section unit, test head and electronic device testing apparatus
摘要 A test section unit provided to a test head body includes a plurality of sockets to be attached with electronic devices to be tested and a performance board as a main substrate. All of the sockets are provided with the performance board without an intervening a socket board.
申请公布号 US8314630(B2) 申请公布日期 2012.11.20
申请号 US20100659033 申请日期 2010.02.23
申请人 MURAKAMI TORU;MINEO HIROYUKI;YOO JU HWAN;ADVANTEST CORPORATION 发明人 MURAKAMI TORU;MINEO HIROYUKI;YOO JU HWAN
分类号 G01R31/00 主分类号 G01R31/00
代理机构 代理人
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