发明名称 Selective memory cell program and erase
摘要 Techniques are disclosed herein for programming memory arrays to achieve high program/erase cycle endurance. In some aspects, only selected word lines (WL) are programmed with other WLs remaining unprogrammed. As an example, only the even word lines are programmed with the odd WLs left unprogrammed. After all of the even word lines are programmed and the data block is to be programmed with new data, the block is erased. Later, only the odd word lines are programmed. The data may be transferred to a block that stores multiple bit per memory cell prior to the erase. In one aspect, the data is programmed in a checkerboard pattern with some memory cells programmed and others left unprogrammed. Later, after erasing the data, the previously unprogrammed part of the checkerboard pattern is programmed with remaining cells unprogrammed.
申请公布号 US8315093(B2) 申请公布日期 2012.11.20
申请号 US201213397428 申请日期 2012.02.15
申请人 DONG YINGDA;KUO TIEN-CHIEN;HEMINK GERRIT JAN;SANDISK TECHNOLOGIES INC. 发明人 DONG YINGDA;KUO TIEN-CHIEN;HEMINK GERRIT JAN
分类号 G11C16/04 主分类号 G11C16/04
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