发明名称 Nonvolatile Memory Devices And Methods Of Fabricating The Same
摘要 Nonvolatile memory devices including a first interlayer insulating film and a second interlayer insulating film separated from each other and are stacked sequentially, a first electrode penetrating the first interlayer insulating film and the second interlayer insulating film, a resistance change film along a top surface of the first interlayer insulating film, side surfaces of the first electrode, and a bottom surface of the second interlayer insulating film, and a second electrode between the first interlayer insulating film and the second interlayer insulating film.
申请公布号 US2012286226(A1) 申请公布日期 2012.11.15
申请号 US201213366875 申请日期 2012.02.06
申请人 SEONG DONG-JUN;PARK CHAN-JIN;SAMSUNG ELECTRONICS CO., LTD. 发明人 SEONG DONG-JUN;PARK CHAN-JIN
分类号 H01L45/00 主分类号 H01L45/00
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