发明名称 SEMICONDUCTOR WAFER COVER
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor wafer cover that can prevent accumulation of materials on a second surface of a semiconductor wafer without scratching the semiconductor wafer. <P>SOLUTION: A semiconductor wafer cover comprises a first cover and a second cover. The first cover houses a semiconductor wafer so as to cover at least an outer edge portion of a second surface of the semiconductor wafer while exposing a first surface of the semiconductor wafer and has a first opening in its center portion. The second cover engages with the first opening and covers the center portion of the second surface of the semiconductor wafer. The inner side surface of the first opening has a taper shape so that the diameter of the first opening becomes smaller toward a non-mounting surface of the semiconductor wafer from a mounting surface of the semiconductor wafer. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012227246(A) 申请公布日期 2012.11.15
申请号 JP20110091770 申请日期 2011.04.18
申请人 TOSHIBA CORP 发明人 YAMAOKA MASASHI
分类号 H01L21/673;B65D85/86;H01L21/683 主分类号 H01L21/673
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