| 摘要 |
Precision delay line instruments and methods for manufacturing precision delay line instruments are described. Example precision delay line instruments may include a plurality of controller activatable delay loops of different delay length design values, and a controller configured to apply a selected delay setting by activating delay loops corresponding to the selected delay setting. The delay length design values may comprise a first set of delay lengths according to a first set of binary step values, and a second set of delay lengths according to a second set of binary step values that is offset from the first set of binary step values. Delay loops corresponding to selected delay settings may be identified in an operating data structure comprising best-fit matched combinations of delay loops that produce more accurate signal delays than one or more other combinations of delay loops.
|
