发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a transistor with excellent electric characteristics including an oxide semiconductor, and a manufacturing method for the same. <P>SOLUTION: A transistor includes an oxide semiconductor film formed on a base insulation film, a gate electrode overlapping with the oxide semiconductor film via a gate insulation film, and a pair of electrodes in contact with the oxide semiconductor film and serving as a source electrode and a drain electrode. The base insulation film includes a first oxide insulation film a part of which is in contact with the oxide semiconductor film, and a second oxide insulation film provided around the first oxide insulation film. An end of the oxide semiconductor film intersecting with the channel width direction of the transistor is located on the second oxide insulation film. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012227523(A) 申请公布日期 2012.11.15
申请号 JP20120086964 申请日期 2012.04.06
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI
分类号 H01L29/786;G02F1/1368;H01L21/28;H01L21/336;H01L21/8242;H01L21/8244;H01L21/8247;H01L27/10;H01L27/105;H01L27/108;H01L27/11;H01L27/115;H01L29/417;H01L29/788;H01L29/792;H01L51/50;H05B33/10 主分类号 H01L29/786
代理机构 代理人
主权项
地址